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RF probe measures high-frequency electrical fields

The HR-E 40-1 passive near-field probe from Langer EMV-Technik measures electrical RF fields as much as 40 GHz. Designed to be linked to a spectrum analyzer, oscilloscope, or related machine, the probe performs measurements on conductors, ICs, metallic housings, and RF buildings throughout growth. For instance, the probe may also help in analyzing the harmonics of 5G assemblies. The instrument additionally permits engineers to report the electrical close to fields and derive an in depth area picture of the construction being measured.

A particular probe head allows measurements to be taken straight on particular person conductor tracks to localize E-field sources. The top ensures an outlined distance of 0.5 mm, even for handheld measurements. The HR-E 40-1 permits a spatial decision of 0.2 mm and transmits the measured indicators to the measuring machine. Transmission habits of the near-field probe is nearly fixed over a frequency vary of 8 to 40 GHz. For spatially reproducible measurements, the probe can be utilized in an computerized positioning system, resembling a Langer scanner.

The HR-E 40-1 near-field probe is bought in a set that features a USB reminiscence stick containing probe traits and viewer software program, a person handbook, and carrying case.

HR-E 40-1 product web page

Langer EMV-Technik

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